Semiconductor Display

Integrated circuit

High end equipment metal Process Solutions

High-Precision Inspection:By leveraging advanced machine vision technologies and high-resolution cameras, the system accurately detects minute defects on chips, such as cracks, scratches, and stains.
High-Speed Processing Capability:Powered by high-performance computing servers and optimized algorithms, the system enables high-throughput appearance inspection of chips, boosting overall manufacturing efficiency.
High Level of Automation:The system integrates automated loading and unloading systems to achieve end-to-end automation from material handling and inspection to sorting, minimizing human intervention.
Multi-Functionality:Beyond appearance defect inspection, the system supports measurement and evaluation of dimensional and shape consistency, enabling versatile inspection capabilities.
Ease of Operation and Maintenance:The system features an intuitive HMI for simplified operation, and a modular architecture that enables efficient maintenance and scalable upgrades.
Strong Compatibility:The system supports a wide range of chip specifications and types, offering flexible adaptation to evolving production line requirements.
Data Logging and Analysis:Real-time inspection data logging and analysis provide actionable insights for optimizing manufacturing processes and improving quality control.
![]() Film Color Variation |
![]() Film Color Variation |
![]() Film Color Variation |
![]() Film Color Variation |
![]() Foreign Particle |
![]() OK |
|
![]() OK |
![]() Breakage |
![]() Foreign Particle |
![]() Breakage |
![]() Foreign Particle |
![]() Foreign Particle |
![]() Foreign Particle |
![]() Foreign Particle |
![]() Foreign Particle |
![]() Breakage |














